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TESTExpress

TESTExpress Standard is an Internet-based data acquisition and control instrumentation system that has been specifically designed to enable you to perform both Low Cycle (LCF) and High Cycle Fatigue (HCF) tests.  TESTExpress Standard is based on the powerful and field proven TESTExpress data acquisition and command waveform generation platform from McGaw Technology.

TESTExpress Standard enables quick and easy test specification, providing a three waveform (Sine, Triangle and Trapezoid) function generator, with a simple to operate user interface.  The Strain to Load switch feature permits accelerated fatigue testing.  The test restart facility enables you to continue testing, minimizing the impacts of tests that shut down.  TESTExpress Standard features extensive test monitoring facilities, including X-Y and Strip-Chart real-time graphical displays.  Cyclic range parameters can also be displayed graphically as a function of cycle number.  Dynamic scaling, ranging and windowing of real-time data are key test monitoring features that provide you the opportunity to progress beyond conventional, paper-based chart recorders.  Users have a great deal of control over their tests, and can alter test parameters while the test is running.  TESTExpress Standard also features a ramp (in the current control mode) to load zero function, enabling the operator to stop the test safely, regardless the control mode.  Finally, TESTExpress Standard can generate many types of test reports, both during and after the test, and can export data to most spreadsheet and graphics programs.  TESTExpress does all of this within a Windows95/98 graphical environment.

 

Key Benefits

High resolution (16-bit) command waveform generation (D/A) and data acquisition (A/D).  TESTExpress can rapidly and continuously acquire and store data to disk, enabling capture of dynamic material behavior, including peak maximums and minimums, where the amount of data per test is dependent only on the available disk space.
Amplitude and Mean Level control, with separately adjustable gains ensures test requirements are accurately and stably met.
Three waveshape (Sine, Triangle, Trapezoid) function generator, enables Low Cycle and High Cycle fatigue tests, including high temperature creep-fatigue tests (strain holds via trapezoidal waveform).  Waveforms can be optionally started positive or negative going, handily addressing compressive cyclic testing needs. 
Real-Time XY and Strip Chart displays, with user-selectable channels for the X and Y axes.  This allows users to dynamically adjust range and offset of each axis, as well as auto-range the display.  Users can dynamically pan and zoom the display, including zooming a user-selected region.
On-line linear regression can be performed on user selected data in the XY display.  Enables easy measurement of elastic modulus data.
Real-Time DVM displays:  Users may select up to four channels for concurrent, real-time display.  The digital volt-meter (DVM) type of display provides peak/valley as well as time-continuous readout of four channels, in the engineering units the user has chosen.  Users can dynamically assign channels for display, as well as independently adjust the precision of the four DVMs.  The four channels can be displayed in two formats: compact format, shown with the XY or Strip-Chart display, or large format, suitable for use during test setup.
Underpeak detection provides the ability to shut down a test when out of range events occur, and also provides the ability to acquire and store data triggered by underpeak events.  Underpeak levels and options are dynamically adjustable during the test.
Test Setup mode enables the operator to monitor key test parameters during test setup (while heating a specimen, and waiting for thermal stabilization, for example), and automatically record significant deviations.
Extensive test reporting, including hysteresis loop reports, parameter range (load, strain) as a function of cycle number, etc.  Test reports are optimized for export to MS Excel.  Operators can produce partial test reports while the test is running.  Test data for prior cycles can be graphically reviewed while the test is running.
Uninterruptible Power Supply (UPS) interface ensures data integrity during power transients and outages, enabling test data to be reliably saved.

TESTExpress.  It's not just better than what you're using today, it's a generation ahead!

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Copyright 2002 McGaw Technology, Inc.
Last modified: 02/27/02